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Seminar Announcement
These events are organized by various sub-sets of the IEEE Toronto Section.
The contact person listed below is the volunteer who has arranged this event.
Please use the e-mail link provided if you have any questions, suggestions,
or concerns.
| Title
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Challenges and Innovations for Development of SOCs
an IEEE Solid-State Circuits Society Distinguished Lecture
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| Speaker
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Professor Sung-Mo (Steve) Kang
Jack Haskin School of Engineering
University of California, Santa Cruz
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| Day and Time
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Friday, December 9, 2005, at 5:10 p.m.
(refreshments will be served)
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| Location
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Room SF1105, Sanford Fleming Building,
University of Toronto, 10 King's College Road
Enter from King's College Road, 1 block east of St. George Street
map - select SF
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| Organizer
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Solid-State Circuits Chapter
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| Contact
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Raymond Chik, Solid-State Circuits Chapter Chair, E-mail: chik@ieee.org
Everyone welcome...
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| Abstract
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Modern SOCs provide amazing functionalities for various applications, in
particular for mobile devices and PDAs with fast graphical display and
communications. New applications for cell phone games, TV, and reliable
transactions demand make the system and chip specifications even tighter
while the fierce competition does not allow any long product development
time. At the same time, as SOC developments move into the 90 nm process
technology arena and beyond, even more technical barriers emerge due to
ever increasing design complexity, rising cost of mask set generation
with modifications required for desired pattern transfers, complex
manufacturing and packaging, and reliability qualification. Process
development has been facing various barriers of its own due to various
physical limits and cost constraints. For instance, the gate oxide
thickness can no longer be scaled as aggressively, if not at all, unless
the high-K dielectric can be implanted at low cost and the reliability
concern are removed. In this talk we will first briefly look at the
history of IC technology, and then discuss challenging SOC issues in I/O
bottleneck, power density, thermal management, subthreshold leakage
currents, and design for manufacturability and yield.
For individual challenging issues, we will consider state-of-the-art
innovations introduced to lower or overcome the barriers as in
bidirectional I/O design, low power design, supply voltage management,
leakage reducing circuit techniques, mathematically rigorous inverse map
techniques for mask correction, and design optimization for minimal
circuit sensitivity to process variations. In the last part of this
talk, we will consider future tradeoffs between 3D and 2D SOCs in view
of the SIP trends of stacking multiple thin chips with sophisticated
packaging, the performance, the manufacturing cost, and the time to
market.
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| Biography
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Sung-Mo (Steve) Kang is Dean, Jack Baskin School of Engineering at the University of California, Santa Cruz. He received his Ph.D. degree in electrical engineering from the University of California at Berkeley in 1975. Until 1985 he was with AT&T Bell Laboratories at Murray Hill and Holmdel, and also served as a faculty member of Rutgers University. In 1985, he joined the University of Illinois at Urbana-Champaign where he was Professor of Electrical and Computer Engineering, Computer Science and Research Professor of Coordinated Science Laboratory and Beckman Institute for Advanced Science and Technology. From August 1995 to December 2000, he served as Head of the Department of Electrical and Computer Engineering. In January 2001, he joined the University of California at Santa Cruz as Dean of Baskin School of Engineering and Professor of Electrical Engineering.
He has served as a member of Board of Governors, Secretary and Treasurer, Administrative Vice President, and 1991 President of IEEE Circuits and Systems Society.
He has served on the editorial boards of Proceeding of the IEEE, IEEE Transactions on Circuits and Systems, International Journal of Circuit Theory and Applications. In 1992-1994, he was the Founding Editor-in-Chief of the IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Dr. Kang is Fellow of IEEE, ACM and AAAS, a Foreign Member of National Academy of Engineering of Korea. He is recipient of the Mac E. Van Valkenburg Award of IEEE Circuits and Systems Society (2005), Outstanding Alumni Award in Electrical Engineering, UC Berkeley (2001), IEEE Third Millennium Medal (2000), SRC Technical Excellence Award (1999), IEEE CAS Society Golden Jubilee Medal (1999), KBS Award in Science and Technology (1998), IEEE Circuits and Systems Society Technical Achievement Award (1997), Humboldt Research Award for Senior US Scientists (1996), IEEE Graduate Teaching Technical Field Award (1996), IEEE Circuits and Systems Society Meritorious Service Award (1994), SRC Inventor Recognition Awards (1993, 1996), IEEE CAS Darlington Prize Paper Award (1993), ICCD Best Paper Award (1986), and Myril B. Reed Best Paper Award (1979). He holds 12 patents, published over 350 papers and co-authored nine books.
His current research interest includes low power VLSI design; optimization for performance, reliability and manufacturability; mixed-signal mixed-technology integrated system; modeling and simulation of semiconductor devices and circuits; optoelectronic circuits and fully optical network systems.
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