Seminar Announcement
These events are organized by various sub-sets of the IEEE Toronto Section.
The contact person listed below is the volunteer who has arranged this event.
Please use the e-mail link provided if you have any questions, suggestions,
or concerns.
| Title
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Metalized Film Capacitor Technology
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| Speaker
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Dr. Steven Boggs, IEEE Fellow
Institute of Materials Science, University of Connecticut
Department of Electrical and Computer Engineering, University of Toronto |
| Day and Time |
Monday, December 8, 2008, 1:00 p.m. – 3:00 p.m. |
| Location |
Hydro One Trinity Square, Downtown Toronto
483 Bay St., South Tower
Basement (B1) Bell Conference Centre Room 4
Queen subway station, suggested pay parking at Toronto City Hall across the street
map |
| Registration |
Please confirm your attendance with Jody Levine, DEIS Southern Ontario Chapter Chair
via e-mail (preferred): or phone: 416.345.6339 |
| Organizer |
Dielectrics and Electrical Insulation Society Chapter |
| Contact |
Jody Levine, E-mail:
|
| Abstract
|
Metalized film capacitor technology has the advantage of being “self-clearing”, which allows the dielectric to be operated at very high field, as a breakdown is not fatal to the capacitors. Windings can also be designed with numerous sections in series within a single winding, which facilitates very high voltage windings. All of these features come at the cost of a number of limitations, notably limited surge current capability as a result of the tenuous nature of the end connections. The details of metalized film capacitor technology will be discussed with an emphasis on advantages and limitations of the technology, which is now being applied to utility capacitors in Europe. |
| Biography
|
Steven Boggs received his Ph.D. and MBA degrees from the University of Toronto in 1972 and 1987, respectively. He spent 12 years with the Research Division of Ontario Hydro and 6 years as Director of Engineering and Research for Underground Systems, Inc. Steve is presently Director of the Electrical Insulation Research Center of the University of Connecticut and Research Professor of Materials Science, Physics, and Electrical Engineering. He is also an Adjunct Professor of Electrical Engineering at the University of Toronto. He has published widely in the areas of partial discharge measurement, high frequency phenomena in power apparatus, high field phenomena in solid dielectrics, capacitor technology, and SF6 insulated systems. He was elected a Fellow of the IEEE for his contributions to the field of SF6 insulated systems. |
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