Prof. Gordon W. Roberts
Director, Microelectronics and Computer Systems Lab
Dept. of Electrical Engineering
McGill University
| Organizer: IEEE Solid State Circuits Society (SSCS) |
| Title: SOC Design And Test: Mixed-Signal And
Analog Considerations |
| Speaker: Prof. Gordon W. Roberts Director, Microelectronics and Computer Systems Lab Dept. of Electrical Engineering McGill University |
| Abstract: With the growing complexity of integrated circuits reaching the hundred-of-million-plus transistor scale, electronic component and system manufacturers are moving towards a commence in third-party electronic component wares (often referred to as cores). Besides the obvious need for standards to assist in their integration, the need for individual verification and test is paramount to the overall product success. From a digital design perspective, the appropriate design and test methodologies are, for the most part, already in place. Scan techniques will continue to be used to move test information about a complex IC, regardless of the core origin. In contrast, no simple method exists in which to move analog information around on an IC without serious degradation of its signal-to-noise ratio. This limits the solutions to carefully crafted test buses, on-chip digitizers and on-chip analog signal generators. Consideration towards using existing chip resources e.g., a DSP-core, can simplify the design of specialized test hardware. In this talk, we shall describe these potential mixed-signal/analog test techniques for cores consisting of A/Ds, D/As, PLLs, and RF transceivers. Results from IC experiments will be provided whenever possible. |
| Biography: Gordon W. Roberts (S'84--M'89) received the B.A.Sc. degree from the University of Waterloo, Canada, in 1983 and the M.A.Sc. and Ph.D. degrees from the University of Toronto, Canada, in 1986 and 1989, respectively, all in electrical engineering. Dr. Roberts presently holds a chaired position at McGill University as the James McGill Professor of Electrical and Computer Engineering. Over the years, he has conducted extensive research on analog integrated circuit design and mixed-signal test issues. Prof. Roberts has received numerous department, faculty and university awards for teaching test & electronics to undergraduate and graduate students, and received several IEEE awards for his work on mixed-signal testing. Most recently, Prof. Roberts together with two of his graduate students received the 2000 Best Paper Award from the International Test Conference. |
| Time and Location: Tuesday, November 20, 2001 Time: 6pm. GB217, Galbraith Bldg., U. of Toronto All are welcome. Refreshments will be served. For more information contact Raymond Chik, chik@ieee.org or Prof. Khoman Phang, kphang@eecg.toronto.edu |
The Institute of Electrical and Electronics Engineers,
Toronto Section
E-mail sec.toronto@ieee.org
Send comments to webmaster@tor.ieee.ca