Lecture Announcement

Organizer: IEEE Toronto Section, Instrumentation & Measurement Society
Title: The Critical Success Factors: What Distinguishes
           Winning Businesses In Product Development
Speaker:
           Dr. Elko Kleinschmidt, Ph.D., MBA
           Director, Engineering and Management Program
           McMaster University.
Place:
          East Kerr Hall, Room QE117
          Ryerson University
          50 Gould St.
          Toronto (Downtown)
Date: Thursday, March 28, 2002, at 6:30 p.m.
           Refreshments at 6:00 p.m.
.
Map: www.ryerson.ca/map/campus.html (building "Q(E)")
Summary:
This lecture is directed towards students, product design engineers, product managers and other professionals who wish to improve their understanding of the major issues affecting the success of new product development initiatives. The results of a multi-firm benchmarking study will be presented in order to expose the critical success factors that set the most successful firms apart from their competitors. The results of this study have become standard benchmarks used throughout the world by firms assessing their performance position in new product development. Measures of performance will be identified and detailed. Three major cornerstones of new product program performance will be identified and discussed.
Speaker:
Dr. Elko Kleinschmidt is a recognized researcher in the field of new product development, innovativeness and the impact of the international dimension on new products. His consulting activities have included market forecasts, new product aspects, benchmarking analyses, portfolio management for new products and developing new product processes for companies. Elko holds a degree in Mechanical Engineering, as well as an MBA and Ph.D. in Business Administration.
Contact:
      Dennis Cecic, P. Eng.
       Ph. (416)826-8662
       E-mail: d.cecic@ieee.org

       Florin Gagiu, M. Sc., Digital Security Controls Ltd.,
       Ph. (905)760-3000, Ext. 2244, Fax (905)760-3020
       E-mail: gagiuf@dscltd.com
                                                                                             
Notes:    All are welcome for this event.
                                  

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The Institute of Electrical and Electronics Engineers, Toronto Section
E-mail sec.toronto@ieee.org

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