| Organizer: IEEE Toronto Section, Instrumentation & Measurement Society | |
| Title: The Critical Success Factors: What
Distinguishes Winning Businesses In Product Development | |
| Speaker: Dr. Elko Kleinschmidt, Ph.D., MBA Director, Engineering and Management Program McMaster University. | |
| Place: East Kerr Hall, Room QE117 Ryerson University 50 Gould St. Toronto (Downtown) | |
| Date: Thursday, March 28, 2002, at 6:30 p.m. Refreshments at 6:00 p.m. . | |
| Map: www.ryerson.ca/map/campus.html (building "Q(E)") | |
| Summary: This lecture is directed towards students, product design engineers, product managers and other professionals who wish to improve their understanding of the major issues affecting the success of new product development initiatives. The results of a multi-firm benchmarking study will be presented in order to expose the critical success factors that set the most successful firms apart from their competitors. The results of this study have become standard benchmarks used throughout the world by firms assessing their performance position in new product development. Measures of performance will be identified and detailed. Three major cornerstones of new product program performance will be identified and discussed. | |
| Speaker: Dr. Elko Kleinschmidt is a recognized researcher in the field of new product development, innovativeness and the impact of the international dimension on new products. His consulting activities have included market forecasts, new product aspects, benchmarking analyses, portfolio management for new products and developing new product processes for companies. Elko holds a degree in Mechanical Engineering, as well as an MBA and Ph.D. in Business Administration. | |
| Contact: Dennis Cecic, P. Eng. Ph. (416)826-8662 E-mail: d.cecic@ieee.org Florin Gagiu, M. Sc., Digital Security Controls Ltd., Ph. (905)760-3000, Ext. 2244, Fax (905)760-3020 E-mail: gagiuf@dscltd.com | |
| Notes: All are welcome for this event. |
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The Institute of Electrical and Electronics Engineers,
Toronto Section
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